From f1732a34df4e0f96be0d3aca3df2eb2efcfa8bbd Mon Sep 17 00:00:00 2001
From: David Oberhollenzer <david.oberhollenzer@sigma-star.at>
Date: Mon, 13 Feb 2017 22:31:16 +0100
Subject: [PATCH] Mention nand bit errors test in mtd-tests section

Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at>
---
 doc/general.xml | 4 ++++
 1 file changed, 4 insertions(+)

diff --git a/doc/general.xml b/doc/general.xml
index 10ea02b..35763e0 100644
--- a/doc/general.xml
+++ b/doc/general.xml
@@ -124,6 +124,10 @@ git://git.infradead.org/users/ahunter/nand-tests.git
 
 <p>The MTD test-suite contains the following tests:</p>
 <ul>
+	<li><b>mtd_nandbiterrs</b>: relevant only for NAND flashes, introduces
+	bit errors and tests for multi-bit error recovery on a NAND page. This
+	mostly tests the ECC controller / driver.</li>
+
 	<li><b>mtd_speedtest</b>: measures and reports read/write/erase speed
 	of the MTD device.</li>
 
-- 
2.49.0