From d9e8da558580513318a36f4ecb1b6e28e41b4de0 Mon Sep 17 00:00:00 2001 From: Dmitry Vyukov Date: Thu, 17 Nov 2022 17:21:01 +0100 Subject: [PATCH] NFC: nci: Extend virtual NCI deinit test Extend the test to check the scenario when NCI core tries to send data to already closed device to ensure that nothing bad happens. Signed-off-by: Dmitry Vyukov Cc: Bongsu Jeon Cc: Krzysztof Kozlowski Cc: Jakub Kicinski Cc: netdev@vger.kernel.org Signed-off-by: David S. Miller --- tools/testing/selftests/nci/nci_dev.c | 11 +++++++++++ 1 file changed, 11 insertions(+) diff --git a/tools/testing/selftests/nci/nci_dev.c b/tools/testing/selftests/nci/nci_dev.c index 162c41e9bcae..1562aa7d60b0 100644 --- a/tools/testing/selftests/nci/nci_dev.c +++ b/tools/testing/selftests/nci/nci_dev.c @@ -888,6 +888,17 @@ TEST_F(NCI, deinit) &msg); ASSERT_EQ(rc, 0); EXPECT_EQ(get_dev_enable_state(&msg), 0); + + /* Test that operations that normally send packets to the driver + * don't cause issues when the device is already closed. + * Note: the send of NFC_CMD_DEV_UP itself still succeeds it's just + * that the device won't actually be up. + */ + close(self->virtual_nci_fd); + self->virtual_nci_fd = -1; + rc = send_cmd_with_idx(self->sd, self->fid, self->pid, + NFC_CMD_DEV_UP, self->dev_idex); + EXPECT_EQ(rc, 0); } TEST_HARNESS_MAIN -- 2.50.1