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8 years agoblock: stress test device hotplugging
Omar Sandoval [Mon, 1 May 2017 19:31:16 +0000 (12:31 -0700)]
block: stress test device hotplugging

Based on my old stress_test_scsi_debug.sh script.

Signed-off-by: Omar Sandoval <osandov@fb.com>
8 years agoloop/001: add to quick group
Omar Sandoval [Mon, 1 May 2017 17:25:52 +0000 (10:25 -0700)]
loop/001: add to quick group

Signed-off-by: Omar Sandoval <osandov@fb.com>
8 years agoFix README links
Omar Sandoval [Fri, 28 Apr 2017 23:24:07 +0000 (16:24 -0700)]
Fix README links

Signed-off-by: Omar Sandoval <osandov@fb.com>
8 years agoloop: test partition scanning
Omar Sandoval [Fri, 28 Apr 2017 23:15:21 +0000 (16:15 -0700)]
loop: test partition scanning

First real test case.

Signed-off-by: Omar Sandoval <osandov@fb.com>
8 years agoInitial commit
Omar Sandoval [Fri, 28 Apr 2017 23:00:25 +0000 (16:00 -0700)]
Initial commit

blktests is heavily inspired by xfstests, with a few important
differences:

- It can run tests on multiple devices at once (serialized for now, but
  this can be changed).
- It has a notion of per-device tests (e.g., for testing specific I/O
  workloads that have been known to cause problems) and no-device tests
  (e.g., for tests that set up pseudo-devices).
- It has documentation.
- It's not ancient, so the framework is much cleaner.

Also included is a set of "meta" tests, i.e., tests that test the
testing framework itself.

Signed-off-by: Omar Sandoval <osandov@fb.com>