]> www.infradead.org Git - mtd-www.git/commitdiff
Mention nand bit errors test in mtd-tests section
authorDavid Oberhollenzer <david.oberhollenzer@sigma-star.at>
Mon, 13 Feb 2017 21:31:16 +0000 (22:31 +0100)
committerDavid Oberhollenzer <david.oberhollenzer@sigma-star.at>
Mon, 20 Feb 2017 13:50:36 +0000 (14:50 +0100)
Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at>
doc/general.xml

index 10ea02b88860915b944e38f47ecb6ca25d80a34b..35763e0f96fb30a1cabf348221b3de59417eec82 100644 (file)
@@ -124,6 +124,10 @@ git://git.infradead.org/users/ahunter/nand-tests.git
 
 <p>The MTD test-suite contains the following tests:</p>
 <ul>
+       <li><b>mtd_nandbiterrs</b>: relevant only for NAND flashes, introduces
+       bit errors and tests for multi-bit error recovery on a NAND page. This
+       mostly tests the ECC controller / driver.</li>
+
        <li><b>mtd_speedtest</b>: measures and reports read/write/erase speed
        of the MTD device.</li>