/**
* enum nvme_id_ctrl_cmic - Controller Multipath IO and Namespace Sharing
- * Capabilities of the controller and NVM subsystem.
- * @NVME_CTRL_CMIC_MULTI_PORT:
- * @NVME_CTRL_CMIC_MULTI_CTRL:
- * @NVME_CTRL_CMIC_MULTI_SRIOV:
- * @NVME_CTRL_CMIC_MULTI_ANA_REPORTING:
+ * Capabilities of the controller and NVM subsystem.
+ * @NVME_CTRL_CMIC_MULTI_PORT: If set, then the NVM subsystem may contain
+ * more than one NVM subsystem port, otherwise
+ * the NVM subsystem contains only a single
+ * NVM subsystem port.
+ * @NVME_CTRL_CMIC_MULTI_CTRL: If set, then the NVM subsystem may contain
+ * two or more controllers, otherwise the
+ * NVM subsystem contains only a single
+ * controller. An NVM subsystem that contains
+ * multiple controllers may be used by
+ * multiple hosts, or may provide multiple
+ * paths for a single host.
+ * @NVME_CTRL_CMIC_MULTI_SRIOV: If set, then the controller is associated
+ * with an SR-IOV Virtual Function, otherwise
+ * it is associated with a PCI Function
+ * or a Fabrics connection.
+ * @NVME_CTRL_CMIC_MULTI_ANA_REPORTING: If set, then the NVM subsystem supports
+ * Asymmetric Namespace Access Reporting.
*/
enum nvme_id_ctrl_cmic {
NVME_CTRL_CMIC_MULTI_PORT = 1 << 0,
};
/**
- * struct nvme_st_result -
- * @dsts:
- * @seg:
- * @vdi:
- * @poh:
- * @nsid:
- * @flba:
- * @sct:
- * @sc:
- * @vs:
+ * struct nvme_st_result - Self-test Result
+ * @dsts: Device Self-test Status: Indicates the device self-test code and the
+ * status of the operation (see &enum nvme_status_result and &enum nvme_st_code).
+ * @seg: Segment Number: Iindicates the segment number where the first self-test
+ * failure occurred. If Device Self-test Status (@dsts) is not set to
+ * #NVME_ST_RESULT_KNOWN_SEG_FAIL, then this field should be ignored.
+ * @vdi: Valid Diagnostic Information: Indicates the diagnostic failure
+ * information that is reported. See &enum nvme_st_valid_diag_info.
+ * @poh: Power On Hours (POH): Indicates the number of power-on hours at the
+ * time the device self-test operation was completed or aborted. This
+ * does not include time that the controller was powered and in a low
+ * power state condition.
+ * @nsid: Namespace Identifier (NSID): Indicates the namespace that the Failing
+ * LBA occurred on. Valid only when the NSID Valid bit
+ * (#NVME_ST_VALID_DIAG_INFO_NSID) is set in the Valid Diagnostic
+ * Information (@vdi) field.
+ * @flba: Failing LBA: indicates the LBA of the logical block that caused the
+ * test to fail. If the device encountered more than one failed logical
+ * block during the test, then this field only indicates one of those
+ * failed logical blocks. Valid only when the NSID Valid bit
+ * (#NVME_ST_VALID_DIAG_INFO_FLBA) is set in the Valid Diagnostic
+ * Information (@vdi) field.
+ * @sct: Status Code Type: This field may contain additional information related
+ * to errors or conditions. Bits 2:0 may contain additional information
+ * relating to errors or conditions that occurred during the device
+ * self-test operation represented in the same format used in the Status
+ * Code Type field of the completion queue entry (refer to &enum nvme_status_field).
+ * Valid only when the NSID Valid bit (#NVME_ST_VALID_DIAG_INFO_SCT) is
+ * set in the Valid Diagnostic Information (@vdi) field.
+ * @sc: Status Code: This field may contain additional information relating
+ * to errors or conditions that occurred during the device self-test
+ * operation represented in the same format used in the Status Code field
+ * of the completion queue entry. Valid only when the SCT Valid bit
+ * (#NVME_ST_VALID_DIAG_INFO_SC) is set in the Valid Diagnostic
+ * Information (@vdi) field.
+ * @vs: Vendor Specific.
*/
struct nvme_st_result {
__u8 dsts;
} __attribute__((packed));
/**
- * enum nvme_status_result -
- * @NVME_ST_RESULT_NO_ERR:
- * @NVME_ST_RESULT_ABORTED:
- * @NVME_ST_RESULT_CLR:
- * @NVME_ST_RESULT_NS_REMOVED:
- * @NVME_ST_RESULT_ABORTED_FORMAT:
- * @NVME_ST_RESULT_FATAL_ERR:
- * @NVME_ST_RESULT_UNKNOWN_SEG_FAIL:
- * @NVME_ST_RESULT_KNOWN_SEG_FAIL:
- * @NVME_ST_RESULT_ABORTED_UNKNOWN:
- * @NVME_ST_RESULT_ABORTED_SANITIZE:
- * @NVME_ST_RESULT_NOT_USED:
- * @NVME_ST_RESULT_MASK:
+ * enum nvme_status_result - Result of the device self-test operation
+ * @NVME_ST_RESULT_NO_ERR: Operation completed without error.
+ * @NVME_ST_RESULT_ABORTED: Operation was aborted by a Device Self-test command.
+ * @NVME_ST_RESULT_CLR: Operation was aborted by a Controller Level Reset.
+ * @NVME_ST_RESULT_NS_REMOVED: Operation was aborted due to a removal of
+ * a namespace from the namespace inventory.
+ * @NVME_ST_RESULT_ABORTED_FORMAT: Operation was aborted due to the processing
+ * of a Format NVM command.
+ * @NVME_ST_RESULT_FATAL_ERR: A fatal error or unknown test error occurred
+ * while the controller was executing the device
+ * self-test operation and the operation did
+ * not complete.
+ * @NVME_ST_RESULT_UNKNOWN_SEG_FAIL: Operation completed with a segment that failed
+ * and the segment that failed is not known.
+ * @NVME_ST_RESULT_KNOWN_SEG_FAIL: Operation completed with one or more failed
+ * segments and the first segment that failed
+ * is indicated in the Segment Number field.
+ * @NVME_ST_RESULT_ABORTED_UNKNOWN: Operation was aborted for unknown reason.
+ * @NVME_ST_RESULT_ABORTED_SANITIZE: Operation was aborted due to a sanitize operation.
+ * @NVME_ST_RESULT_NOT_USED: Entry not used (does not contain a test result).
+ * @NVME_ST_RESULT_MASK: Mask to get the status result value from
+ * the &struct nvme_st_result.dsts field.
*/
enum nvme_status_result {
- NVME_ST_RESULT_NO_ERR = 0x0,
- NVME_ST_RESULT_ABORTED = 0x1,
+ NVME_ST_RESULT_NO_ERR = 0x0,
+ NVME_ST_RESULT_ABORTED = 0x1,
NVME_ST_RESULT_CLR = 0x2,
NVME_ST_RESULT_NS_REMOVED = 0x3,
NVME_ST_RESULT_ABORTED_FORMAT = 0x4,
};
/**
- * enum nvme_st_code -
- * @NVME_ST_CODE_NONE:
- * @NVME_ST_CODE_SHORT:
- * @NVME_ST_CODE_EXTENDED:
- * @NVME_ST_CODE_VS:
+ * enum nvme_st_code - Self-test Code value
+ * @NVME_ST_CODE_RESERVED: Reserved.
+ * @NVME_ST_CODE_SHORT: Short device self-test operation.
+ * @NVME_ST_CODE_EXTENDED: Extended device self-test operation.
+ * @NVME_ST_CODE_VS: Vendor specific.
+ * @NVME_ST_CODE_SHIFT: Shift amount to get the code value from the
+ * &struct nvme_st_result.dsts field.
*/
enum nvme_st_code {
- NVME_ST_CODE_SHIFT = 4,
- NVME_ST_CODE_RESRVED = 0x0,
+ NVME_ST_CODE_RESERVED = 0x0,
NVME_ST_CODE_SHORT = 0x1,
NVME_ST_CODE_EXTENDED = 0x2,
NVME_ST_CODE_VS = 0xe,
+ NVME_ST_CODE_SHIFT = 4,
+};
+
+/**
+ * enum nvme_st_curr_op - Current Device Self-Test Operation
+ * @NVME_ST_CURR_OP_NOT_RUNNING: No device self-test operation in progress.
+ * @NVME_ST_CURR_OP_SHORT: Short device self-test operation in progress.
+ * @NVME_ST_CURR_OP_EXTENDED: Extended device self-test operation in progress.
+ * @NVME_ST_CURR_OP_VS: Vendor specific.
+ * @NVME_ST_CURR_OP_RESERVED: Reserved.
+ * @NVME_ST_CURR_OP_MASK: Mask to get the current operation value from the
+ * &struct nvme_self_test_log.current_operation field.
+ * @NVME_ST_CURR_OP_CMPL_MASK: Mask to get the current operation completion value
+ * from the &struct nvme_self_test_log.completion field.
+ */
+enum nvme_st_curr_op {
+ NVME_ST_CURR_OP_NOT_RUNNING = 0x0,
+ NVME_ST_CURR_OP_SHORT = 0x1,
+ NVME_ST_CURR_OP_EXTENDED = 0x2,
+ NVME_ST_CURR_OP_VS = 0xe,
+ NVME_ST_CURR_OP_RESERVED = 0xf,
+ NVME_ST_CURR_OP_MASK = 0xf,
+ NVME_ST_CURR_OP_CMPL_MASK = 0x7f,
};
/**
- * enum nvme_st_valid_diag_info -
- * @NVME_ST_VALID_DIAG_INFO_NSID:
- * @NVME_ST_VALID_DIAG_INFO_FLBA:
- * @NVME_ST_VALID_DIAG_INFO_SCT:
- * @NVME_ST_VALID_DIAG_INFO_SC:
+ * enum nvme_st_valid_diag_info - Valid Diagnostic Information
+ * @NVME_ST_VALID_DIAG_INFO_NSID: NSID Valid: if set, then the contents of
+ * the Namespace Identifier field are valid.
+ * @NVME_ST_VALID_DIAG_INFO_FLBA: FLBA Valid: if set, then the contents of
+ * the Failing LBA field are valid.
+ * @NVME_ST_VALID_DIAG_INFO_SCT: SCT Valid: if set, then the contents of
+ * the Status Code Type field are valid.
+ * @NVME_ST_VALID_DIAG_INFO_SC: SC Valid: if set, then the contents of
+ * the Status Code field are valid.
*/
enum nvme_st_valid_diag_info {
NVME_ST_VALID_DIAG_INFO_NSID = 1 << 0,
};
/**
- * struct nvme_self_test_log -
- * @current_operation:
- * @completion:
- * @result:
+ * struct nvme_self_test_log - Device Self-test (Log Identifier 06h)
+ * @current_operation: Current Device Self-Test Operation: indicates the status
+ * of the current device self-test operation. If a device
+ * self-test operation is in process (i.e., this field is set
+ * to #NVME_ST_CURR_OP_SHORT or #NVME_ST_CURR_OP_EXTENDED),
+ * then the controller shall not set this field to
+ * #NVME_ST_CURR_OP_NOT_RUNNING until a new Self-test Result
+ * Data Structure is created (i.e., if a device self-test
+ * operation completes or is aborted, then the controller
+ * shall create a Self-test Result Data Structure prior to
+ * setting this field to #NVME_ST_CURR_OP_NOT_RUNNING).
+ * See &enum nvme_st_curr_op.
+ * @completion: Current Device Self-Test Completion: indicates the percentage
+ * of the device self-test operation that is complete (e.g.,
+ * a value of 25 indicates that 25% of the device self-test
+ * operation is complete and 75% remains to be tested).
+ * If the @current_operation field is cleared to
+ * #NVME_ST_CURR_OP_NOT_RUNNING (indicating there is no device
+ * self-test operation in progress), then this field is ignored.
+ * @result: Self-test Result Data Structures, see &struct nvme_st_result.
*/
struct nvme_self_test_log {
__u8 current_operation;
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