Documentation: ABI: testing: rtq6056: Update ABI docs

Add documentation for the usage of voltage channel integration time.

Signed-off-by: ChiYuan Huang <cy_huang@richtek.com>
Link: https://lore.kernel.org/r/1658242365-27797-4-git-send-email-u0084500@gmail.com
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>

diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index e81ba6f5e1c8732fa9a1c168d493ec684de05e82..7faec5b3a5534e96152cc4632cc004e85f1ce9cb 100644 (file)
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -2038,3 +2038,14 @@ Description:
                Available range for the forced calibration value, expressed as:
 
                - a range specified as "[min step max]"
+
+What:          /sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency
+What:          /sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency
+What:          /sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency
+KernelVersion: 5.20
+Contact:       linux-iio@vger.kernel.org
+Description:
+               Some devices have separate controls of sampling frequency for
+               individual channels. If multiple channels are enabled in a scan,
+               then the sampling_frequency of the scan may be computed from the
+               per channel sampling frequencies.