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nvme-print: show feat fields for FID = {0x17,0x12} and refactoring
authorGollu Appalanaidu <anaidu.gollu@samsung.com>
Sun, 21 Feb 2021 12:04:16 +0000 (17:34 +0530)
committerKeith Busch <kbusch@kernel.org>
Mon, 22 Feb 2021 19:18:58 +0000 (12:18 -0700)
commitf62a3c41cd7fcbc9a47960071807494a5509c4ac
tree530da05ce2aa9fdbbc9cf641f7b5f2ee1c48febftree
parentd407efcb5c02dd4ee0a076d4cdceb7c18c7e6df8commit | diff
nvme-print: show feat fields for FID = {0x17,0x12} and refactoring

Showing Sanitize Config (FID = 0x17) and Read Recovery Level
Config (RRL) (FID = 0x12) feature fields. Refactor the FID = 0x0
and non-defined/reserved FIDs response.

Signed-off-by: Gollu Appalanaidu <anaidu.gollu@samsung.com>
nvme-print.c diff | blob | history
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