]> www.infradead.org Git - users/hch/blktests.git/commit
Fix unintentional skipping of tests
authorKlaus Jensen <k.jensen@samsung.com>
Wed, 22 Apr 2020 07:44:36 +0000 (09:44 +0200)
committerOmar Sandoval <osandov@fb.com>
Thu, 30 Apr 2020 19:01:03 +0000 (12:01 -0700)
commitccf7dc4140706351b482b858378e62ef897ed01c
tree0267c0ce916242dfca024bf58405eeec16d5d831
parenta668c61064f2b08f895338562fbc2f2e2849d052
Fix unintentional skipping of tests

cd11d001fe86 ("Support skipping tests from test{,_device}()") breaks a
good handful of tests.

For example, block/005 uses _test_dev_is_rotational to check if the
device is rotational and uses the result to size up the fio run. As a
side-effect, _test_dev_is_rotational also sets SKIP_REASON, which (since
commit cd11d001fe86) causes the test to print out a "[not run]" even
through the test actually ran successfully.

Fix this by renaming the existing helpers to _require_foo (e.g. a
_require_test_dev_is_rotational) and add the non-_require variant where
needed.

Fixes: cd11d001fe86 ("Support skipping tests from test{,_device}()")
Reviewed-by: Shin'ichiro Kawasaki <shinichiro.kawasaki@wdc.com>
Signed-off-by: Klaus Jensen <k.jensen@samsung.com>
[Omar: simplify new _test_dev helpers]
Signed-off-by: Omar Sandoval <osandov@fb.com>
14 files changed:
check
common/iopoll
common/rc
new
tests/block/003
tests/block/007
tests/block/011
tests/block/019
tests/nvme/032
tests/nvme/rc
tests/scsi/006
tests/scsi/rc
tests/zbd/007
tests/zbd/rc