Correct self-test-log output

Correct self-test-log output

Changes determination of Device Self-Test in progress to be based on the
Current Device Self-Test Operation field as opposed to the Current
Device Self-Test Completion field.

Current implementation assumes that the Current Device Self-Test
Completion field will be 100% when no Device Self-Test operation is in
progress. This is an unsafe assumption as the NVMe Specification
explicitly specifies that the Current Device Self-Test Completion field
is invalid when no Device Self-Test operation in progress as indicated
by a value of 0 in the Current Device Self-Test Operation field.

A safe assumption is to use the Current Device Self-Test Operation field
which will be 0 when no Device Self-Test operation is in progress.

Signed-off-by: ekohande <abe.kohandel@intel.com>